DTW k-means clustering for fault detection in photovoltaic modules

Abstract

The increase in the use of photovoltaic (PV) energy in the world has shown that the useful life and maintenance of a PV plant directly depend on theability to quickly detect severe faults on a PV plant. To solve this problem of detection, data based approaches have been proposed in the literature.However, these previous solutions consider only specific behavior of one or few faults. Most of these approaches can be qualified as supervised, requiring an enormous labelling effort (fault types clearly identified in each technology). In addition, most of them are validated in PV cells or one PV module. That is hardly applicable in large-scale PV plants considering their complexity. Alternatively, some unsupervised well-known approaches based on data try to detect anomalies but are not able to identify precisely the type of fault. The most performant of these methods do manage to efficiently group healthy panels and separate them from faulty panels. In that way, this article presents an unsupervised approach called DTW K-means. This approach takes advantages of both the dynamic time warping (DWT) metric and the Kmeans clustering algorithm as a data-driven approach. The results of this mixed method in a PV string are compared to diagnostic labels established by visual inspection of the panels.