{"id":"2307.06322","title":"Deep Learning of Crystalline Defects from TEM images: A Solution for the Problem of \"Never Enough Training Data\"","url":"https://codeofpaper.com/paper/2307.06322","arxiv_url":"https://arxiv.org/abs/2307.06322","published":"2023-07-12","code":"none","best":null,"most_starred_community":null,"implementations":[],"possible_matches":0}