Deep Learning-Based Residual Useful Lifetime Prediction for Assets with Uncertain Failure Modes

Yuqi Su, Xiaolei Fang
5/9/2024
cs.LGeess.SPstat.AP

No confident code implementation found for this paper.

Abstract

Industrial prognostics focuses on utilizing degradation signals to forecast and continually update the residual useful life of complex engineering systems. However, existing prognostic models for systems with multiple failure modes face several challenges in real-world applications, including overlapping degradation signals from multiple components, the presence of unlabeled historical data, and the similarity of signals across different failure modes. To tackle these issues, this research introduces two prognostic models that integrate the mixture (log)-location-scale distribution with deep learning. This integration facilitates the modeling of overlapping degradation signals, eliminates the need for explicit failure mode identification, and utilizes deep learning to capture complex nonlinear relationships between degradation signals and residual useful lifetimes. Numerical studies validate the superior performance of these proposed models compared to existing methods.

View on arXivView PDF

Code Implementations

No confident code match yet

We couldn't find an author-owned or strongly-evidenced community implementation for this paper. Any repos shown below are weak matches — verify before relying on them.

No code implementations found yet.

Know of an implementation? Let us know in the comments below!

Similar Papers

Cite this paper

@article{su2024deep,
  title  = {Deep Learning-Based Residual Useful Lifetime Prediction for Assets with Uncertain Failure Modes},
  author = {Yuqi Su and Xiaolei Fang},
  year   = {2024},
  eprint = {2405.06068},
  archivePrefix = {arXiv},
  url    = {http://arxiv.org/abs/2405.06068v2}
}

Add a badge to your README

Shows whether official code is linked for this paper.

Code of Paper badge
[![Code of Paper](https://codeofpaper.com/badge/2405.06068.svg)](https://codeofpaper.com/paper/2405.06068)

Discussion