FuzzAug: Data Augmentation by Coverage-guided Fuzzing for Neural Test Generation

Yifeng He, Jicheng Wang, Yuyang Rong, Hao Chen
6/12/2024
cs.SEcs.AI

No official code found. Best implementation: SecurityLab-UCD/FuzzAug (9 stars, MIT, last commit 2025-09-18).

Abstract

Testing is essential to modern software engineering for building reliable software. Given the high costs of manually creating test cases, automated test case generation, particularly methods utilizing large language models, has become increasingly popular. These neural approaches generate semantically meaningful tests that are more maintainable compared with traditional automatic testing methods like fuzzing. However, the diversity and volume of unit tests in current datasets are limited, especially for newer but important languages. In this paper, we present a novel data augmentation technique, FuzzAug, that introduces the benefits of fuzzing to large language models by introducing valid testing semantics and providing diverse coverage-guided inputs. Doubling the size of training datasets, FuzzAug improves the performance from the baselines significantly. This technique demonstrates the potential of introducing prior knowledge from dynamic software analysis to improve neural test generation, offering significant enhancements in neural test generation.

View on arXivView PDF

Code Implementations(1)

MIT

[EMNLP'25] FuzzAug: Data Augmentation by Coverage-guided Fuzzing for Neural Test Generation

91Rust, ShellNov 9, 20231 years agoMIT
data-augmentationemnlpemnlp2025llmrust+1 more

Similar Papers

Cite this paper

@article{he2024fuzzaug,
  title  = {FuzzAug: Data Augmentation by Coverage-guided Fuzzing for Neural Test Generation},
  author = {Yifeng He and Jicheng Wang and Yuyang Rong and Hao Chen},
  year   = {2024},
  eprint = {2406.08665},
  archivePrefix = {arXiv},
  url    = {http://arxiv.org/abs/2406.08665v3}
}

Add a badge to your README

Shows whether official code is linked for this paper.

Code of Paper badge
[![Code of Paper](https://codeofpaper.com/badge/2406.08665.svg)](https://codeofpaper.com/paper/2406.08665)

Discussion