Towards Efficient Pixel Labeling for Industrial Anomaly Detection and Localization

Hanxi Li, Jingqi Wu, Lin Yuanbo Wu, Hao Chen, Deyin Liu +1 more
7/3/2024
cs.CV

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Abstract

In the realm of practical Anomaly Detection (AD) tasks, manual labeling of anomalous pixels proves to be a costly endeavor. Consequently, many AD methods are crafted as one-class classifiers, tailored for training sets completely devoid of anomalies, ensuring a more cost-effective approach. While some pioneering work has demonstrated heightened AD accuracy by incorporating real anomaly samples in training, this enhancement comes at the price of labor-intensive labeling processes. This paper strikes the balance between AD accuracy and labeling expenses by introducing ADClick, a novel Interactive Image Segmentation (IIS) algorithm. ADClick efficiently generates "ground-truth" anomaly masks for real defective images, leveraging innovative residual features and meticulously crafted language prompts. Notably, ADClick showcases a significantly elevated generalization capacity compared to existing state-of-the-art IIS approaches. Functioning as an anomaly labeling tool, ADClick generates high-quality anomaly labels (AP $= 94.1\%$ on MVTec AD) based on only $3$ to $5$ manual click annotations per training image. Furthermore, we extend the capabilities of ADClick into ADClick-Seg, an enhanced model designed for anomaly detection and localization. By fine-tuning the ADClick-Seg model using the weak labels inferred by ADClick, we establish the state-of-the-art performances in supervised AD tasks (AP $= 86.4\%$ on MVTec AD and AP $= 78.4\%$, PRO $= 98.6\%$ on KSDD2).

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@article{li2024towards,
  title  = {Towards Efficient Pixel Labeling for Industrial Anomaly Detection and Localization},
  author = {Hanxi Li and Jingqi Wu and Lin Yuanbo Wu and Hao Chen and Deyin Liu and Chunhua Shen},
  year   = {2024},
  eprint = {2407.03130},
  archivePrefix = {arXiv},
  url    = {http://arxiv.org/abs/2407.03130v2}
}

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