Random Gradient Masking as a Defensive Measure to Deep Leakage in Federated Learning

Joon Kim, Sejin Park
8/15/2024
cs.LGcs.CR

No confident code implementation found for this paper.

Abstract

Federated Learning(FL), in theory, preserves privacy of individual clients' data while producing quality machine learning models. However, attacks such as Deep Leakage from Gradients(DLG) severely question the practicality of FL. In this paper, we empirically evaluate the efficacy of four defensive methods against DLG: Masking, Clipping, Pruning, and Noising. Masking, while only previously studied as a way to compress information during parameter transfer, shows surprisingly robust defensive utility when compared to the other three established methods. Our experimentation is two-fold. We first evaluate the minimum hyperparameter threshold for each method across MNIST, CIFAR-10, and lfw datasets. Then, we train FL clients with each method and their minimum threshold values to investigate the trade-off between DLG defense and training performance. Results reveal that Masking and Clipping show near to none degradation in performance while obfuscating enough information to effectively defend against DLG.

View on arXivView PDF

Code Implementations

No confident code match yet

We couldn't find an author-owned or strongly-evidenced community implementation for this paper. Any repos shown below are weak matches — verify before relying on them.

No code implementations found yet.

Know of an implementation? Let us know in the comments below!

Similar Papers

Cite this paper

@article{kim2024random,
  title  = {Random Gradient Masking as a Defensive Measure to Deep Leakage in Federated Learning},
  author = {Joon Kim and Sejin Park},
  year   = {2024},
  eprint = {2408.08430},
  archivePrefix = {arXiv},
  url    = {http://arxiv.org/abs/2408.08430v1}
}

Add a badge to your README

Shows whether official code is linked for this paper.

Code of Paper badge
[![Code of Paper](https://codeofpaper.com/badge/2408.08430.svg)](https://codeofpaper.com/paper/2408.08430)

Discussion