Detecting and Classifying Defective Products in Images Using YOLO

Zhen Qi, Liwei Ding, Xiangtian Li, Jiacheng Hu, Bin Lyu +1 more
12/22/2024
cs.CV

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Abstract

With the continuous advancement of industrial automation, product quality inspection has become increasingly important in the manufacturing process. Traditional inspection methods, which often rely on manual checks or simple machine vision techniques, suffer from low efficiency and insufficient accuracy. In recent years, deep learning technology, especially the YOLO (You Only Look Once) algorithm, has emerged as a prominent solution in the field of product defect detection due to its efficient real-time detection capabilities and excellent classification performance. This study aims to use the YOLO algorithm to detect and classify defects in product images. By constructing and training a YOLO model, we conducted experiments on multiple industrial product datasets. The results demonstrate that this method can achieve real-time detection while maintaining high detection accuracy, significantly improving the efficiency and accuracy of product quality inspection. This paper further analyzes the advantages and limitations of the YOLO algorithm in practical applications and explores future research directions.

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Cite this paper

@article{qi2024detecting,
  title  = {Detecting and Classifying Defective Products in Images Using YOLO},
  author = {Zhen Qi and Liwei Ding and Xiangtian Li and Jiacheng Hu and Bin Lyu and Ao Xiang},
  year   = {2024},
  eprint = {2412.16935},
  archivePrefix = {arXiv},
  url    = {http://arxiv.org/abs/2412.16935v1}
}

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