Model-driven Stochastic Trace Clustering

Jari Peeperkorn, Johannes De Smedt, Jochen De Weerdt
6/30/2025
cs.LG

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Abstract

Process discovery algorithms automatically extract process models from event logs, but high variability often results in complex and hard-to-understand models. To mitigate this issue, trace clustering techniques group process executions into clusters, each represented by a simpler and more understandable process model. Model-driven trace clustering improves on this by assigning traces to clusters based on their conformity to cluster-specific process models. However, most existing clustering techniques rely on either no process model discovery, or non-stochastic models, neglecting the frequency or probability of activities and transitions, thereby limiting their capability to capture real-world execution dynamics. We propose a novel model-driven trace clustering method that optimizes stochastic process models within each cluster. Our approach uses entropic relevance, a stochastic conformance metric based on directly-follows probabilities, to guide trace assignment. This allows clustering decisions to consider both structural alignment with a cluster's process model and the likelihood that a trace originates from a given stochastic process model. The method is computationally efficient, scales linearly with input size, and improves model interpretability by producing clusters with clearer control-flow patterns. Extensive experiments on public real-life datasets demonstrate that while our method yields superior stochastic coherence and graph simplicity, traditional fitness metrics reveal a trade-off, highlighting the specific utility of our approach for stochastic process analysis.

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Cite this paper

@article{peeperkorn2025modeldriven,
  title  = {Model-driven Stochastic Trace Clustering},
  author = {Jari Peeperkorn and Johannes De Smedt and Jochen De Weerdt},
  year   = {2025},
  eprint = {2506.23776},
  archivePrefix = {arXiv},
  url    = {http://arxiv.org/abs/2506.23776v2}
}

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