Regret Analysis of Posterior Sampling-Based Expected Improvement for Bayesian Optimization

Shion Takeno, Yu Inatsu, Masayuki Karasuyama, Ichiro Takeuchi
7/13/2025
stat.MLcs.LG

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Abstract

Bayesian optimization is a powerful tool for optimizing an expensive-to-evaluate black-box function. In particular, the effectiveness of expected improvement (EI) has been demonstrated in a wide range of applications. However, theoretical analyses of EI are limited compared with other theoretically established algorithms. This paper analyzes a randomized variant of EI, which evaluates the EI from the maximum of the posterior sample path. We show that this posterior sampling-based random EI achieves the sublinear Bayesian cumulative regret bounds under the assumption that the black-box function follows a Gaussian process. Finally, we demonstrate the effectiveness of the proposed method through numerical experiments.

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Cite this paper

@article{takeno2025regret,
  title  = {Regret Analysis of Posterior Sampling-Based Expected Improvement for Bayesian Optimization},
  author = {Shion Takeno and Yu Inatsu and Masayuki Karasuyama and Ichiro Takeuchi},
  year   = {2025},
  eprint = {2507.09828},
  archivePrefix = {arXiv},
  url    = {http://arxiv.org/abs/2507.09828v3}
}

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