Automated Annotation of Shearographic Measurements Enabling Weakly Supervised Defect Detection

Jessica Plassmann, Nicolas Schuler, Michael Schuth, Georg von Freymann
12/5/2025
cs.CV

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Abstract

Shearography is an interferometric technique sensitive to surface displacement gradients, providing high sensitivity for detecting subsurface defects in safety-critical components. A key limitation to industrial adoption is the lack of high-quality annotated datasets, since manual labeling remains labor-intensive, subjective, and difficult to standardize. We introduce an automated workflow that generates defect annotations from shearography measurements using deep learning, producing high-resolution segmentation and bounding-box labels. Evaluation against expert-labeled data demonstrates sufficient accuracy to enable weakly supervised training, reducing manual effort and supporting scalable dataset creation for robust defect detection.

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Cite this paper

@article{plassmann2025automated,
  title  = {Automated Annotation of Shearographic Measurements Enabling Weakly Supervised Defect Detection},
  author = {Jessica Plassmann and Nicolas Schuler and Michael Schuth and Georg von Freymann},
  year   = {2025},
  eprint = {2512.06171},
  archivePrefix = {arXiv},
  url    = {http://arxiv.org/abs/2512.06171v1}
}

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