{"id":"2603.20519","title":"End-to-End Optimization of Polarimetric Measurement and Material Classifier","url":"https://codeofpaper.com/paper/2603.20519","arxiv_url":"https://arxiv.org/abs/2603.20519","published":"2026-03-20","code":"none","best":null,"most_starred_community":null,"implementations":[],"possible_matches":0}