A nonparametric two-sample test using a parametric integral probability metric

Yuha Park, Yongdai Kim
6/15/2026
stat.MLcs.LG

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Abstract

Detecting distributional differences between two independent samples is a fundamental problem in statistics and machine learning. Nonparametric two-sample testing provides a principled framework for determining whether two samples are drawn from the same underlying distribution, without assuming any specific parametric form for the distribution. In this study, we propose a new two-sample test statistic based on a newly introduced integral probability metric (IPM), using a specially designed parametric discriminator class with a single node of a neural network. We show that the resulting test statistic, called PReLU-IPM, is nonparametric and establish theoretical guarantees for the associated two-sample testing procedure, PReLU-TST, including its consistency and asymptotical equivalence to nonparametric IPM-based tests under regularity conditions. By analyzing multiple simulated and real benchmark datasets, we demonstrate that PReLU-TST achieves higher power across a range of alternatives or performs comparably to its competitors, for finite samples.

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Cite this paper

@article{park2026nonparametric,
  title  = {A nonparametric two-sample test using a parametric integral probability metric},
  author = {Yuha Park and Yongdai Kim},
  year   = {2026},
  eprint = {2606.16941},
  archivePrefix = {arXiv},
  url    = {http://arxiv.org/abs/2606.16941v1}
}

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