{"id":"2607.05187","title":"SMART: A Machine Learning and Monte Carlo Framework for Rapid Analysis of Stochastic Transistor Aging and Process Variation in Digital Circuits","url":"https://codeofpaper.com/paper/2607.05187","arxiv_url":"https://arxiv.org/abs/2607.05187","published":"2026-07-06","code":"none","best":null,"most_starred_community":null,"implementations":[],"possible_matches":0}