ConMem: Contribution-Aware Memory for Long-Horizon Manufacturing Inspection Logs

Bingchen Liu, Yuanyuan Fang, Lei Liu, Guangyuan Dong, Xing Fu +4 more
7/30/2026
cs.AI

No confident code implementation found for this paper.

Abstract

Long-horizon steel-equipment inspection requires reasoning over heterogeneous records accumulated across repeated inspection cycles. Existing retrieval-augmented generation systems treat historical logs as a static corpus and retain records without estimating their diagnostic value, failing to report early risk. To this end, we propose ConMem, a contribution-aware memory framework for LLM-assisted equipment inspection, supporting a human-in-the-loop early-risk screening system. Specifically, our ConMem first segments inspection logs into functional evidence units, then estimates each memory unit's contribution to downstream diagnosis through a Shapley-style estimation, and finally retains high-value evidence under a constrained memory budget. In experiments, we evaluate ConMem on real-world dataset and ConMem achieves 76.0% QA accuracy, exceeding the strongest directly comparable baseline. Relative to the naive 8K-context LLM baselines, it reduces the average number of input tokens by 88.2% and response time by 86.6%. Ablation studies also show that the functional-role-aware segmentation and contribution-based valuation are helping prioritize weak degradation signals for targeted field inspection. Practical deployments further confirm that ConMem retains the weak early signal across three inspection cycles, providing an early-stage seal-wear alert targeted for on-site inspectors.

View on arXivView PDF

Code Implementations

No confident code match yet

We couldn't find an author-owned or strongly-evidenced community implementation for this paper. Any repos shown below are weak matches — verify before relying on them.

No code implementations found yet.

Know of an implementation? Let us know in the comments below!

Similar Papers

Cite this paper

@article{liu2026conmem,
  title  = {ConMem: Contribution-Aware Memory for Long-Horizon Manufacturing Inspection Logs},
  author = {Bingchen Liu and Yuanyuan Fang and Lei Liu and Guangyuan Dong and Xing Fu and Yuanyuan Gao and Shuyue Wei and Xin Li and Xiangtian Meng},
  year   = {2026},
  eprint = {2607.28126},
  archivePrefix = {arXiv},
  url    = {http://arxiv.org/abs/2607.28126v1}
}

Add a badge to your README

Shows whether official code is linked for this paper.

Code of Paper badge
[![Code of Paper](https://codeofpaper.com/badge/2607.28126.svg)](https://codeofpaper.com/paper/2607.28126)

Discussion